AL-QUADERI, G. D.; AHMED, S. P.; RABBANI, K. S.- e. Determination of the Thickness of a Resistive Material Layer in a Finite Volume Conductor using Focused Impedance Method (FIM) – a simulation study. Bangladesh Journal of Medical Physics, [S. l.], v. 7, n. 1, p. 8–23, 2015. DOI: 10.3329/bjmp.v7i1.25255. Disponível em: https://banglajol.info/index.php/BJMP/article/view/25255. Acesso em: 17 jul. 2024.