Al-Quaderi, Golam Dastegir, et al. “Determination of the Thickness of a Resistive Material Layer in a Finite Volume Conductor Using Focused Impedance Method (FIM) – a Simulation Study”. Bangladesh Journal of Medical Physics, vol. 7, no. 1, Oct. 2015, pp. 8-23, doi:10.3329/bjmp.v7i1.25255.