HASHMI, G; BASHER, MK; HOQ, M; RAHMAN, MH. Band gap Measurement of P – type Monocrystalline Silicon Wafer. Bangladesh Journal of Scientific and Industrial Research, [S. l.], v. 53, n. 3, p. 179–184, 2018. DOI: 10.3329/bjsir.v53i3.38263. Disponível em: https://banglajol.info/index.php/BJSIR/article/view/38263. Acesso em: 16 apr. 2025.