HASHMI, G.; BASHER, M.; HOQ, M.; RAHMAN, M. Band gap Measurement of P – type Monocrystalline Silicon Wafer. Bangladesh Journal of Scientific and Industrial Research, [S. l.], v. 53, n. 3, p. 179–184, 2018. DOI: 10.3329/bjsir.v53i3.38263. Disponível em: https://banglajol.info/index.php/BJSIR/article/view/38263. Acesso em: 17 jul. 2024.