Determination of Non-linear Refractive Index of Pure SnO2 and TiO2 Doped SnO2 Thin Films Using Z-scan Technique

Authors

  • PD Gupta Department of Physics, University of Dhaka, Dhaka 1000, Bangladesh
  • Ishtiaque M Syed Department of Physics, University of Dhaka, Dhaka 1000, Bangladesh

DOI:

https://doi.org/10.3329/dujs.v71i2.69092

Keywords:

Z-scan; Ar-ion laser; non-linear refractive index; thin films.

Abstract

In this research work the non-linear refractive indices n2 was determined for the pure SnO2 and TiO2 doped SnO2 thin films by using the Z-scan technique. We have used a continuous wave Ar-ion laser with incident wavelength of 514 nm as the source. n2 was measured by varying three quantities: the incident laser intensity, thickness of the pure SnO2 films and doping concentration of TiO2 in SnO2 films. From the experimental results, the values of n2 were found to be increasing with the increase of thickness of the pure SnO2 films and also with the increase of doping concentration of TiO2 in SnO2 thin films.

Dhaka Univ. J. Sci. 71(2): 104-110, 2023 (July)

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Published

2023-10-18

How to Cite

Gupta, P., & Syed, I. M. (2023). Determination of Non-linear Refractive Index of Pure SnO2 and TiO2 Doped SnO2 Thin Films Using Z-scan Technique. Dhaka University Journal of Science, 71(2), 104–110. https://doi.org/10.3329/dujs.v71i2.69092

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